TERS results on Si/SiO2 measured using OmegaScope (Nanofinder 30 - SmartSPM)

Simultaneous AFM topography, TERS intensity and Raman Shift images of Si/SiO2 obtained using the Reflection system configuration.

Download reflection TERS results

*Data obtained with DEMO system at TII office (Tokyo).

*The research was conducted in Research Program on Development of Innovative Technology of Japan Science and Technology Agency (JST).