C32H66
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145x145nm topography scan of C32H66 lamellar stripes taken with fpN01-DLC cantilever. Several interesting defects at the intersection of the islands with different orientation are clearly seen in the image.
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Two consecutive 75x75nm topography scans of the same area. Defects of lamellar packing is much better seen in these images.
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50x50nm topography scan of C32H66 lamellar stripes taken with fpN01-DLC cantilever. The width of lamellar stripes is about 4nm.
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