AIST-NT will attend SciX 2012, the FACSS Meeting and Exposition in Kansas City, MO.

AIST-NT will attend SciX 2012, the FACSS Meeting and Exposition in Kansas City, MO.

Starting on Monday 1st October 2012, we will be in booth number 40 of the Exposition hall and look forward to discussing with you our latest tools for high-resolution scanning probe microscopy and co-localised spectroscopy, including Raman, Photoluminescence, TERS and SERS.

Categories: