Materials

The magnetic domain structure of garnet film is being reorganized by a cantilever tip with a magnetic coating. The 1300 nm IR laser of the AIST-NT AFM system allows the user to clearly observe the sample during the scanning process. In the meantime, it also points out the fact that the selected cantilever is not suitable for MFM measurement of such magnetic samples.

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In this phase image, the lower right nanoparticle clearly shows the pentagonal shape. The ability to distinguish the shape of such a small nanoparticle despite significant convolution effect is quite an impressive result. Click to see additional 600x600nm topography and phase images of this nanoparticle as well as 300x300nm images.

AIST-NT’s AFM provides clear advantages in nanoparticle imaging compared to SEM. Nanoparticles sized from 30 to 150 nm can be imaged without disturbing their position on the substrate.

Investigate your samples using the SmartSPM scanning probe microscope in MFM mode!

Surface of CVD diamond, 25 microns scan. Sample courtesy of Technological Center TWINN LLC.