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November 12, 2015 AIST -NT would like to congratulate our customer Dr. Debdulal Roy of the National Physical Laboratory, United Kingdom on the acceptance of his group's paper: Probing individual point defects in graphene via near-field Raman scattering October 13, 2015 AIST-NT is very happy to announce the recent publication "Nanoscale imaging and identification of a four-component carbon sample", resulting from the collaboration of our customers at Oak Ridge National Lab and the Technische Universität Chemnitz October 05, 2015 AIST-NT would like to congratulate our customer, Professor Sanford A. Asher! October 05, 2015 AIST-NT would like to congratulate our customer, Professor Frank Bright! September 15, 2015 New analytical solution brings nanoscale chemical imaging to new levels of ease and automation. July 29, 2015 August 9, 2015 AIST-NT will be exhibiting at the 2015 SPIE Optics+Photonics in San Diego, California July 28, 2015 August 2, 2015 AIST-NT will be exhibiting at the 2015 MSA Microscopy and Microanalysis Conference in Portland, Oregon « 3 of 17 »	Applications Biology Fast scanning Materials MFM Nanolithography Nanoparticles PFM Polymers Raman / TERS Test samples Events Products SmartSPM	SPM Probes Web Store

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